{"@context":"https://neupai.io/schema/v0.2","@type":"StructuredNewsArticle","identity":{"article_id":"skhynix_20260522_hypidia-dmi-semiconductor-inspection","canonical_url":"https://news.skhynix.co.kr/ambassador-hypidia-1-1/","ai_url":null,"publisher":{"name":"SK하이닉스 뉴스룸","domain":"news.skhynix.co.kr","type":"online"},"author":"unknown","published_at":"2026-05-22T01:50:21.573Z","updated_at":null,"language":"en","article_type":"feature","originality":"self_produced"},"content":{"headline":"[Hi-Pedia Part 1 – Foundational Technology] Analysis · Metrology · Inspection, DMI: A Comprehensive Checkup for Perfect Semiconductors","summary":"SK hynix is introducing DMI (Analysis, Metrology, and Inspection), a foundational technology essential to the semiconductor manufacturing process, through its Hi-Pedia series.","topics":["semiconductors","technology"],"geography":["KR"],"entities":[{"name":"SK hynix","canonical_id":"corp:kr:sk-hynix","type":"company","role_in_article":"primary_subject","metadata":{"ticker":"000660.KS","parent":"corp:kr:sk-group"}}],"claims":[],"ai_emotional_context":{"valence":0.2,"arousal":0.2,"primary_emotions":[{"emotion":"indifferent","intensity":0.3}],"secondary_emotions":[],"emotional_triggers":[]}},"provenance":{"source_chain":["primary_reporting"],"original_source_url":null,"related_articles":[]},"temporal":{"freshness":"recent","next_update_expected":null},"access":{"license":"neupai_standard","attribution_required":true,"structured_data":"free","full_text_available":false,"full_text_access":null}}