{"@context":"https://neupai.io/schema/v0.2","@type":"StructuredNewsArticle","identity":{"article_id":"skhynix_20260522_hypidia-dmi-semiconductor-inspection","canonical_url":"https://news.skhynix.co.kr/ambassador-hypidia-1-1/","ai_url":null,"publisher":{"name":"SK하이닉스 뉴스룸","domain":"news.skhynix.co.kr","type":"online"},"author":"unknown","published_at":"2026-05-22T01:50:21.573Z","updated_at":null,"language":"ko","article_type":"feature","originality":"self_produced"},"content":{"headline":"[하이피디아 1편 – 기반기술] 분석 · 계측 · 검사, 완벽한 반도체를 위한 종합검진 DMI","summary":"SK하이닉스가 하이피디아 시리즈를 통해 반도체 제조 과정에서 필수적인 DMI(분석·계측·검사) 기반기술을 소개하고 있다.","topics":["반도체","기술"],"geography":["KR"],"entities":[{"name":"SK하이닉스","canonical_id":"corp:kr:sk-hynix","type":"company","role_in_article":"primary_subject","metadata":{"ticker":"000660.KS","parent":"corp:kr:sk-group"}}],"claims":[],"ai_emotional_context":{"valence":0.2,"arousal":0.2,"primary_emotions":[{"emotion":"indifferent","intensity":0.3}],"secondary_emotions":[],"emotional_triggers":[]}},"provenance":{"source_chain":["primary_reporting"],"original_source_url":null,"related_articles":[]},"temporal":{"freshness":"recent","next_update_expected":null},"access":{"license":"neupai_standard","attribution_required":true,"structured_data":"free","full_text_available":false,"full_text_access":null}}